Characteristic Mode Analysis of surface current distributions on metallic structures exposed to HIRF- and DCI-excitations

This paper treats Characteristic Mode Analyses of three-dimensional test objects in the context of EMC. Based on computed Characteristic Modes and mode-specific physical quantities, series expansions for HIRF- and DCI-induced surface currents are deduced. The contribution of single Characteristic Modes to surface currents at different test frequencies is analyzed. HIRF- and DCI-excitations are compared with regard to their surface current distributions in their resonance region determined by Characteristic Mode Analysis.